论文部分内容阅读
对Ｃｏ／Ｐｔ多层膜进行Ｘ射线小角衍射分析，测量出多层膜的周期厚度，解释多层膜小角衍射主峰之间出现次峰的现象，并确立了次峰个数与膜周期数之间的关系。
Small-angle X-ray diffraction analysis of Co / Pt multilayers was carried out to measure the periodic thickness of multilayers, and to explain the phenomenon of minor peaks between the main peaks of small angle diffraction of multilayers. The number of secondary peaks and the number of membrane cycles Relationship between.