论文部分内容阅读
通过对磺基水杨酸体系中铝合金一步法阳极氧化自然发色的研究,确定了获得古铜色氧化膜的最佳工艺,并研究了各因素对氧化膜性能的影响。通过对恒电流阳极氧化的V-t特征曲线的研究,确定该体系的阳极氧化为硬质氧化。研究并估算了阻挡层的厚度及阻挡层对O~(2-)的电阻率。确认了阻挡层氧化膜具有半导体特征.
Through the one-step anodic oxidation of aluminum alloy in sulfosalicylic acid system, the best process of obtaining the bronze oxide film was determined and the influence of various factors on the performance of the oxide film was studied. Through the study of the V-t characteristic curve of galvanostatic anodization, the anodic oxidation of the system was confirmed as hard oxidation. The thickness of the barrier layer and the resistivity of the barrier layer to O ~ (2-) were studied and estimated. It was confirmed that the barrier oxide film has a semiconductor characteristic.