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集成电路设计与测试是当今计算机技术研究的主要问题之一。集成电路测试技术是生产高性能集成电路和提高集成电路成品率的关键。基于固定型故障模型的测试方法已不能满足高性能集成电路,尤其是对CMOS电路的测试要求。CMOS电路的瞬态电流(IDDT)测试方法自80年代提出以来,已被工业界采用,作为高可靠芯片的测试手段。
Integrated circuit design and testing is one of the major issues in computer technology research today. IC testing technology is the key to producing high-performance integrated circuits and improving integrated circuit yield. Based on the fixed fault model test method can not meet the high-performance integrated circuits, especially for CMOS circuit testing requirements. CMOS circuit transient current (IDDT) test method since the 1980s has been adopted by the industry as a means of testing high-reliability chips.