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在电路元件筛选方面,我们认为组件老化条件不宜过苛,因属损坏性试验,过苛条件对组件寿命不利,反而降低整机的可靠性。譬如,我厂生产的车床数模箱和台式电子计算机所用元、组件皆未经老化处理,但经使用至今证明年损坏率是较低的,数模箱的年损坏率在5‰左右。又如有的单位,高温老化160℃,我们降为100℃,电老化80℃+6V,我们降为80℃+5V,经初步使用,证明没有明显不同处,如老化中的损坏率、分板调试中的损坏率
In the screening of circuit components, we believe that component aging conditions should not be too harsh, because of the damage test, over-harsh conditions on the component life is adverse, but reduce the reliability of the machine. For example, the lathes and molds used in our factory and the components and components used in the desktop computers have not been aged yet, but the annual damage rate has been proved to be low by using them so far. The annual damage rate of the mold box is about 5 ‰. Another example is the unit, high temperature aging 160 ℃, we reduced to 100 ℃, electric aging 80 ℃ +6 V, we reduced to 80 ℃ +5 V, after initial use, proved no significant difference, such as the rate of damage in aging, Board debug damage rate