In this paper, an improved NHPP model is proposed by replacing constant fault removal time with time-varying fault removal delay in NHPP model, proposed by Dani
The test vector compression is a keytechnique to reduce IC test time and cost since theexplosion of the test data of system on chip (SoC) inrecent years. To red
Based on the classification to the attribute information of auctioned commodity, the valuation signal of auctioned commodity is categorized into two groups: cod