据《中国电子报》2007年4月17日报导,测试技术的进步主要体现在测试设备的发展上。几十年来,测试设备从测试小规模集成电路发展到测试中规模、大规模和超大规模集成电路,设备水平从测试仪发展到大规模测试系统。现今测试系统已向高速、多管脚、多片并行同测和SoC测试的方向发展 According to “China Electronics News” April 17, 2007 reported that the progress of test technology is mainly reflected in the development of test equipment. For decades, test equipment has evolved from testing small scale integrated circuits to test-scale, large-scale, and very large scale integrated circuits, with equipment ranging from testers to large-scale test systems. Today’s test systems have moved toward high-speed, multi-pin, multi-chip simultaneous testing and SoC testing