通过 Ｉ Ｒ， Ｘ射线衍射分别研究了复合纳滤膜致密层的化学结构及其与性能的关系。采用扫描电镜（ Ｓ Ｅ Ｍ ）和原子力显微镜（ Ａ Ｆ Ｍ ）分别对膜的断面、表面形态作了研究。 The chemical structure of the dense layer of the composite nanofiltration membrane and its relationship with the properties were studied respectively by IR and X-ray diffraction. Scanning electron microscopy (SEM) and atomic force microscope (AFM) were used to investigate the morphology and morphology of the membrane.