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COHERENT ELECTRON TOMOGRAPHYA PROBE FOR DYNAMICS AND SHAPE OF NANOMATERIALS AT ATOMIC RESOLUTION RES
[会议论文] 作者：F-R.Chen,L.-G.Chen,D.Van Dyck,A.Kirkland,C.Kisielowski,
来源：第十六届北京分析测试学术报告会 年份：2015
The ultimate goal for materials scientists is to understand the functions and to control the properties of materials....
COHERENT ELECTRON TOMOGRAPHY:A PROBE FOR DYNAMICS AND SHAPE OF NANOMATERIALS AT ATOMIC RESOLUTION RE
[会议论文] 作者：F-R.Chen,L.-G.Chen,D.Van Dyck,A.Kirkland,C.Kisielowski,
来源：第十六届北京分析测试学术报告会 年份：2015
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