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[期刊论文] 作者：Y.Zhou,C.S.Yang,J.A. Chen,G.F. Ding,L. Wang,M.J Wang,Y.M Zhang,T.H Zhang,
来源：Acta Metallurgica Sinica(English Letters) 年份：2004
Microbridge testing is used to measure the Young’s modulus and residual stresses ofmetallic films. Nickel film microbridges with widths of several hundred mic...
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