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[期刊论文] 作者：YufeiXing,JiaxingDong,SarvagyaDwivedi,UmarKhan,WimBogaerts,
来源：PhotonicsResearch 年份：2018
We experimentally demonstrate extraction of silicon waveguide geometry with subnanometer accuracy using optical measurements. Effective and group indices of silicon-on-insulator (SOI) waveguides are extracted from the optical measurements. ......
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