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[期刊论文] 作者：Linna Zhao,Peihong Yu,Zixiang Guo,Dawei Yan,Hao Zhou,Jinbo Wu,Zhiqiang Cui,Huarui Sun,Xiaofeng Gu,
来源：中国物理B（英文版） 年份：2017
The progressive current degradation and breakdown behaviors of GaN-based light emitting diodes under high reversebias stress are studied by combining the electr...
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