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A Simple Method for Multichip IGBT Modules Failure Prognostics Using Deviation of Gate Current After
[会议论文] 作者：Luowei Zhou,Shengqi Zhou,
来源：第五届中国高校电力电子与电力传动学术年会 年份：2011
this paper presents our effort in studying the failure prognostics of multichipIGBT modules，and a simple practical approach is introduced，which uses the deviations ofpeak gate charge current after par...
[会议论文] 作者：Xi Hengdong,Zhou Shengqi,Zhou Quan,Xia Keqing,
来源：2013中国力学大会 年份：2013
We report an experimental study of the three-dimensional spatial structure of the low-frequency temperature oscillations in a cylindrical Rayleigh-Bénard convection cell.Through simultaneous multipoin...
[会议论文] 作者：Shengqi Zhou,Andrew J.Wain,Patrick G.Nicholson,Alan Turnbull,
来源：The 60th Annual Meeting of The International Society of Elec 年份：2009
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