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[期刊论文] 作者:YinliLi,JianZhang,ShifaWu,PengfeiLi,ShiPan, 来源:ChineseOpticsLetters 年份:2005
AF/RSNOM is a new kind of scanning probe microscope developed in our lab, which is a combination of atomic force microscope and reflection scanning near field optical microscopy (AF/RSNOM) working in equi-amplitude tapping mode. This paper ......
[期刊论文] 作者:JianZhang,YinliLi,GaoshuJian,PingZhou,ShifaWu, 来源:ChineseOpticsLetters 年份:2005
A new nano-meter scale resolution optical imaging mode and functional prototype of photon scanning tunneling microscope (PSTM) combined with atomic force microscope (AFM) named as AF/PSTM are introduced, and the advantages of AF/PSTM are di......
[期刊论文] 作者:尹莉莉,张汝波,林忠会,YinLili,ZhangRubo,LinZhonghui, 来源:黑龙江科技信息 年份:2011
本文通过对荣华二采区10...
[期刊论文] 作者:邹启杰,张汝波,唐平鹏,尹丽丽,ZouQijie,ZhangRubo,TangPingpeng,YinLili, 来源:黑龙江科技信息 年份:2011
本文通过对荣华二采区10...
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