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[期刊论文] 作者:Z.W.Yu,L.Wang,X.L.Xu,J.B.Qiang, 来源:金属学报:英文版 年份:2004
The growth process of low-temperature plasma-nitriding layer was investigated by scanning electron microscopy(SEM)and X-ray diffraction(XRD).The layer is compos...
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