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[期刊论文] 作者:Jie Xiao,Zhan-Hui Shi,Jian-Hui Jiang,Xu-Hua Yang,Yu-Jiao Huang,Hai-Gen Hu,
来源:计算机科学技术学报(英文版) 年份:2019
The reliability allowance of circuits tends to decrease with the increase of circuit integration and the application of new technology and materials, and the ha...
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