AtomicForceMicroscopy(AFM)相关论文
Silicon waveguide cantilever displacement sensor for potential application for on-chip high speed AF
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目的 以原子力显微镜(atomic force microscopy,AFM)观察比较鼠疫耶尔森菌EV76株与正常兔血清以及兔抗F1抗体反应后微观形态变化,......
