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Wafer-Level Burn-In and Test (WLBT) is a method for burning-in semiconductor devices while still in wafer form. This has many advantages, one of which is the production of burned-in, Known Good Die (KGD.)Wafer-Level Burn-In and Test (WLBT) is a method for burning-in semiconductor devices while still in wafer form. This has many advantages, one of which is the production of burned-in, Known Good Die (KGD.)