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5. DIRECT DETECTION-THE FUTURE OF TEM IMAGING

DIRECT DETECTION-THE FUTURE OF TEM IMAGING

来源 :第十六届北京分析测试学术报告会 | 被引量 : 0次 | 上传用户：duanluchao

【摘 要】

：

The essential function of an electron microscope is its ability to "see" more sample details.Imaging detector is responsible for capturing "data" generated in a

【作 者】

：

Ming Pan 

【机 构】

：

Gatan,Inc.,5794W.LasPositasBlvd.,Pleasanton,CA94588,USA

【出 处】

：

第十六届北京分析测试学术报告会

【发表日期】

：

2015年10期

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论文部分内容阅读

The essential function of an electron microscope is its ability to "see" more sample details.Imaging detector is responsible for capturing "data" generated in an electron microscope.

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