La0.7Sr0.3MnO3 (LSMO) films were prepared by d.c.magnetron sputter deposition where a sputtering pressure ranging from 0.1 Pa to 0.9 Pa was applied to the samples.And then the films were annealed at 700 ℃ for 1 h in air.Glance angle X-ray diffraction was used to confirm the microstructure of LSMO films.Fourier transform infrared spectroscopy was used to measure the bonding structure of LSMO films.The temperature dependence of resistance of the films was measured by traditional four-point method in PPMS system.The results indicate that the samples have a single perovskite structure and different texture orientation.The big sputtering pressure is favor of depressing the formation of texture.The bond length of Mn-O-Mn doesnt change monotonously with the increase of sputtering pressure.