【摘 要】
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Some advanced crystalline silicon solar cells and modules technologies present evolutions of their backside metallisation.This results in new needs in terms of non-permanent contacting for characteriz
【机 构】
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Pasan SA, Switzerland Centre Suisse d'Electroniq
【出 处】
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SNEC 第九届(2015)国际太阳能产业及光伏工程(上海)论坛
论文部分内容阅读
Some advanced crystalline silicon solar cells and modules technologies present evolutions of their backside metallisation.This results in new needs in terms of non-permanent contacting for characterization, such as Ⅰ-Ⅴ measurement and electroluminescence imaging.This is first of all the case for back-contacting solar cell technologies, such as Metal Wrap Through (MWT) and Inter digital Back Contact (IBC) cell architectures.This is also applicable for biracial solar cells with bus bar-less metallization on the backside.While these technologies demonstrate very high potential for performance increase and/or electricity cost decrease, new metrological solutions are needed.
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