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Ge-rich Si1-xGex films with a hybrid amorphous/nanocrystalline structure were deposited by jet-type inductively coupled plasma chemical-vapor deposition(jet-ICPCVD)[1].The structural evolution of the deposited films after annealing at various temperatures(Ta)was investigated.Experimental results show that the as-deposited film is hybrid-structured with amorphous and clusters.As arising Ta continually,a transformation from clusters to small SiGe NCs and finally to composite NCs with Ge core and SiGe shell is revealed.