一、径迹蚀刻技术简介带电粒子和重离子等,能在许多绝缘固体(如云毋、玻璃、塑料)中产生微观径迹,其直径一般小于50(?)。1959年西尔克和巴恩斯在云母中观察到此种现象。这一发现导致了新型粒子探测器的建立。十几年来,径迹蚀刻技术 First, track etching technology introduction Charged particles and heavy ions, etc., in many insulating solids (such as clouds, glass, plastic) in the micro-track, the diameter is generally less than 50 (?). In 1959 Silke and Barnes observed this phenomenon in mica. This discovery led to the establishment of a new particle detector. More than a decade, track etching technology