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分析了广州地铁3号线车门控制器非易失性存储器故障原因,发现该故障与存储器外围电路有关,并提出了解决措施,已得到现场试验验证。
The failure reason of the door controller non-volatile memory of Guangzhou Metro Line 3 is analyzed. It is found that the fault is related to the peripheral circuit of the memory and the solution is proposed and verified by the field test.