提出了一种确定模式BIST的低功耗设计方案,它是在基于折叠计数器的基础上,采用LFSR编码折叠计数器种子,并通过选定的存储折叠距离来控制确定的测试模式生成,使得产生的测试矢量之间实现单跳变。由于是在确定测试矢量基础上进行的研究,而没有改变原来的测试矢量,因而故障覆盖率不会改变,这样既保证了高故障覆盖率又解决不同种子所生成的测试模式之间的重叠、冗余。研究结果表明该方案不仅具有很好的数据压缩率,而且证明了该方案的有效性。 This paper proposes a low-power design scheme to determine the mode BIST. Based on the folding counter, LFSR is used to code the counter of the folding counter, and the determined test pattern generation is controlled by the selected storage folding distance, so that the generated Single jump between test vectors. Because it is based on the study of determining the test vector, without changing the original test vector, so the fault coverage will not change, thus ensuring high fault coverage and solve the different test patterns generated by the overlap between the seeds, redundancy. The results show that this scheme not only has good data compression rate, but also proves the validity of this scheme.