应用多晶x射线衍射法测定ZSM-5平均晶粒大小,工作谱线取002衍射,测定结果与电镜数据吻合。还制作了2θ在13°附近的工作曲线,该曲线普遍适用于理学衍射仪测定低角区衍射峰,以求平均晶粒大小。由于该法容易找到样品的独立衍射峰,因此有很大实用意义。本法测定ZSM-5体系,测定范围130～2000A。 The average grain size of ZSM-5 was determined by polycrystalline X-ray diffraction. The work line was taken as 002 diffraction. The measured results were in good agreement with those of electron microscope. A working curve with 2θ around 13 ° has also been made, which is generally applicable to the determination of low-angle diffraction peaks by Rigaku diffractometers in order to average the grain size. Because this method can easily find the independent diffraction peak of the sample, it is of great practical significance. The method for the determination of ZSM-5 system, the determination of the range of 130 ~ 2000A.