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本文综述当前的短期频率稳定度。讨论四种测量频率抖动的方法,并且用表列出典型结果。叙述从边带功率谱变换为均方根值频率起伏的方法,以便作为有用的研究手段。假设晶体振荡器的短期频率不稳定度是由晶体管振荡器电路中的各种噪声机构,例如表起伏(闪烁噪声),本(积)基(极)中的扩散和复合起伏(散弹噪声),热噪声或约翰逊噪声等引起的,计标机辅助研究计划着于改进振荡器的设计程序。特别有意义的问题,是能否最佳地选择电路参数和工作点。从而使振荡器对噪声起伏的灵敏度最小。
This article summarizes the current short-term frequency stability. Discuss four ways to measure frequency jitter and tabulate typical results. Describe the method of translating from the power spectrum of the sideband to the rms frequency fluctuations in order to be useful as a research tool. It is assumed that the short-term frequency instability of the crystal oscillator is caused by various noise mechanisms in the transistor oscillator circuit such as meter fluctuations (flicker noise), diffusion and complex fluctuations (shot noise) in the base (pole) , Thermal noise or Johnson noise, etc. The builder-sponsored research program is designed to improve the oscillator design process. Of particular interest is the ability to choose the best circuit parameters and operating points. This minimizes the oscillator’s sensitivity to noise fluctuations.