论文部分内容阅读
介绍了四种常用分析方法在自组装功能膜结构及其界面层表征中的新进展。红外光谱是常用的结构分析方法,运用掠角反射红外光谱及衰减全反射红外光谱可以分析自组装薄膜表面、界面结构以及分子链段的取向;XPS分析可以确定薄膜的化学组成;电镜的运用使直接观察体系的形态、形貌成为可能;ESR是研究聚合物在溶液中自组装成胶束过程的有力工具。
The recent progress of four commonly used analytical methods in the characterization of self-assembled functional films and their interface layers is introduced. Infrared spectroscopy is a commonly used method of structural analysis. By using sweep-angle reflection infrared spectroscopy and attenuated total reflection infrared spectroscopy, the orientation of self-assembled films, interface structures and molecular chains can be analyzed. XPS analysis can determine the chemical composition of thin films. It is possible to directly observe the morphology and morphology of the system. ESR is a powerful tool to study the self-assembly of polymers into micelles in solution.