Photoluminescence (PL) and lasing properties of InAs/GaAs quantum dots (QDs) with different growth procedures prepared by metalorganic chemical vapour deposition are studied.PL measurements show that the low growth rate QD sample has a larger PL intensity and a narrower PL line width than the high growth rate sample.During rapid thermal annealing,however,the low growth rate sample shows a greater blueshift of PL peak wavelength.This is caused by the larger InAs layer thickness which results from the larger 2-3 dimensional transition critical layer thickness for the QDs in the low-growth-rate sample.A growth technique including growth interruption and in-situ annealing,named indium flush method,is used during the growth of GaAs cap layer,which can flatten the GaAs surface effectively.Though the method results in a blueshift of PL peak wavelength and a broadening of PL line width,it is essential for the fabrication of room temperature working QD lasers.