A novel reflected terahertz-emission microscopy is proposed and developed for improving the spatial resolution of THz imaging. When attaching a bow-tie antenna directly onto a thin generation crystal, the reflected THz waves can be collected and detected by a photoconductive antenna, and the spatial resolution is decided by the diameter of focused pump beam. In this way, the detected resolution can be largely improved and tunable. The configuration and characteristics of this microscopy are described in detail.