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本文用新的切趾函数研究了傅里叶变换红外(FT-IR)光谱仪中切趾对分辨本领的影响。结果表明,切趾不一定导致分辨本领下降,选择合适的切趾函数,甚至可使切趾后的分辨本领高于未经切趾时的分辨本领,而又不明显升高其邻近次峰。对真空区熔硅单晶干涉图的处理表明,新的切趾函数在实用上优于FT-IR光谱仪中使用的切趾函数。
In this paper, the new apodization function was used to study the effect of apodization on resolving power in Fourier transform infrared (FT-IR) spectrometer. The results show that apodization does not necessarily lead to a decrease in resolving power. Choosing the appropriate apodization function can even make the resolving ability after apodization higher than that without apodization, and does not significantly increase the adjacent secondary peak. The treatment of the vacuum fused silicon single crystal interference pattern shows that the new apodization function is practically superior to the apodization function used in the FT-IR spectrometer.