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本文论述了红外辐射测温中各种干扰的分类和各种干扰产生的机理。这些干扰包括光路中的干扰、外来光干扰和黑度变化产生的干扰。文中还叙述了克服或减小上述各种干扰的措施。最后叙述了杯形表面辐射温度计(又名前置反射器辐射温度计)的一般结构和原理。利用这种辐射温度计可以测量黑度大于0.5的任何工业表面的真实温度,这些表面可以是光滑的、粗糙的或者是静止的和移动的。
This article discusses the classification of various disturbances in infrared radiation thermometry and the mechanism of various disturbances. These interferences include interference in the optical path, interference from outside light and interference from changes in blackness. The article also describes the measures to overcome or reduce the above-mentioned various kinds of interference. Finally, the general structure and principle of cup-shaped surface radiation thermometer (aka pre-reflector radiation thermometer) are described. With this radiation thermometer it is possible to measure the true temperature of any industrial surface with a blackness greater than 0.5, which surfaces can be smooth, rough or stationary and moving.