In previous studies, we found that high-LET carbon ions induced autophagy in a LET-dependent mannerin tumor cells. However, the mechanisms underlying are still
The gate dielectric thickness decreases dramatically with the continuous scaling of MOS devices,which has serious consequences on the leakage current and the po
The main work of the irradiation technique group focuses on the following two aspects in 2016:1.Technique support We have had about 772.5 h beam time for 39 rou