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在HL-1装置的输样机构上安放了硅收集探针。经过55次高功率托卡马克放电辐照后,对于因石墨孔栏被腐蚀而溅射蒸发,并沉积在硅收集探针上的杂质涂层进行了俄歇电子能谱(AES)分析,获得无主动冷却石墨孔栏被腐蚀而溅射蒸发出来的碳杂质流通量约为8×10~(13)cm~(-2)·S~(-1),金属重杂质镍和铬较GH39高镍钢孔栏时降低44％左右。
A silicon collection probe was placed on the delivery mechanism of the HL-1 device. After 55 high-power tokamak discharges, Auger Electron Spectroscopy (AES) analysis was performed on the impurity coating sputtered by corrosion of the graphite hole column and deposited on the silicon collection probe to obtain The flux of carbon impurities evaporated and sputter-eroded by the hole without active cooling was about 8 × 10 ~ (13) cm ~ (-2) · S ~ (-1), the heavy metal nickel and chromium were higher than GH39 Nickel steel hole column reduced about 44%.