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通过分析总线胚胎电子阵列的结构特点和工作原理,将多态系统理论引入到阵列的可靠性分析中,采用通用生成函数方法建立了阵列的可靠性分析模型。与基于n/k系统的阵列可靠性模型进行对比分析,验证了基于多态系统阵列可靠性模型的正确性和有效性。利用建立的阵列可靠性分析模型对总线胚胎电子阵列的可靠性进行分析,根据阵列的可靠性要求指导阵列的结构设计。同时,对比不同规模总线胚胎电子阵列与典型胚胎电子阵列的可靠性,分析总线胚胎电子阵列的性能。分析结果表明建立的可靠性模型能够准确有效地分析阵列的可靠性,将阵列的可靠性分析与工作状态相结合,对阵列的结构设计和预防性维修决策具有重要的指导意义。
By analyzing the structural characteristics and working principle of the bus embryonic electronic array, the theory of polymorphic system is introduced into the reliability analysis of the array, and the reliability analysis model of the array is established by the common generation function method. Compared with the array reliability model based on n / k system, the correctness and validity of the reliability model based on the multi-state system array are verified. The reliability of the bus embryo electronic array is analyzed by using the established array reliability analysis model, and the structural design of the array is guided according to the reliability requirements of the array. At the same time, the reliability of bus arrays and typical embryonic arrays was compared, and the performance of bus embryonic arrays was analyzed. The analysis results show that the established reliability model can accurately and effectively analyze the reliability of the array, combine the reliability analysis of the array with the working status, and have important guiding significance for the structural design and preventive maintenance decision of the array.