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利用微波吸收相敏技术检测了硫增感条件下的卤化银光电子衰减行为,获得了硫增感乳剂的自由光电子和浅俘获光电子的时间分辨谱信号.分析了AgBrI T颗粒乳剂硫增感产物的陷阱效应与增感时间和增感温度的关系.确定了硫增感产物的陷阱效应随增感时间和增感温度的变化趋势,其变化顺序依次是空穴陷阱、浅电子陷阱和深电子陷阱.
The microwave absorbing phase sensitive technique was used to detect the decay behavior of silver halide photoelectrons under sulfur sensitization conditions and the time-resolved spectra signals of free photoelectrons and shallow photoelectrons of sulfur-sensitized emulsion were obtained.The sulfur sensitized products of AgBrI T particles The relationship between the trap effect and the sensitization time and sensitization temperature.The trap effect of sulfur sensitized products with the change trend of sensitization time and sensitization temperature was determined.The order of the change was as follows: hole trap, shallow electron trap and deep electron trap.