通过控制蒸发源电流、源和样品间距及扩散时间 ,室温下在C60 单晶 (111)解理面上制备出Rb3 C60 。用低温同步辐射角分辨光电子谱测量了样品的能带结构。观察到的能带色散表明样品为单晶薄膜。用X光电子谱首次研究了Rb3 C60 与C60相界面的稳定性。结果表明温度低于约 4 2 0K时界面是稳定的 By controlling the source current, source and sample spacing and diffusion time, Rb3 C60 was prepared on the C60 single crystal (111) cleavage plane at room temperature. The band structure of the sample was measured by low-temperature synchrotron radiation angle-resolved photoelectron spectroscopy. The observed band dispersion indicates that the sample is a single crystal thin film. The stability of the interface between R60 C60 and C60 was first studied by X-ray photoelectron spectroscopy. The results show that the interface is stable at temperatures below about 420K