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介绍了镀膜技术和红外热像仪测量镀膜材料发射率的方法,并利用红外热像法分析了基底材料对薄膜发射率的影响。通过实验研究了镀膜时间与膜厚度变化导致的测量波段发射率的变化关系。
The paper introduces the coating technology and the method of measuring the emissivity of the coating material by infrared thermal imager, and analyzes the influence of the substrate material on the emissivity of the film by means of infrared thermography. The relationship between the emissivity of the measurement band and the emissivity of the measurement band was studied experimentally by experiment.