基于导电型原子力显微镜和扫描隧道显微镜的对比观察,研究高定向热解石墨表面上残留石墨片的导电增强现象.根据样品电阻的测量数据,将这种现象归结为导电针尖与石墨表面的点接触问题,并且发现接触电导和接触点处局域的电子密度成正比,从而确定石墨表面的局域导电增强现象的原因在于残留在石墨表面的石墨片具有较高的电子密度. Based on the comparison between the conductive atomic force microscope and scanning tunneling microscope, the phenomenon of conductive enhancement of the residual graphite sheet on the surface of pyrolytic graphite was studied.According to the measurement data of the sample resistance, this phenomenon was attributed to the point contact between the conductive tip and the graphite surface Problem and found that the contact conductance is proportional to the local electron density at the point of contact and thus the local conduction enhancement of the graphite surface is determined by the fact that the graphite sheet remaining on the graphite surface has a higher electron density.