一、引言七十年代期间,由于表面科学迅速发展的需要,研究固体表面组分、表面结构或表面原子的电子结构的各种谱仪不断出现.软X射线出现电势谱(SXAPS)就是其中之一.在出现电势谱仪中,用一定能量的电子轰击固体(靶)表面,然后用光电法测定所产生的软X射线强度与轰击电子能量之间的关系.大家知道,在这种软X射线中包含着 I. Introduction During the 1970s, due to the rapid development of surface science, various spectrometers that study the electronic structure of solid surface components, surface structures, or surface atoms are emerging. One of these is the X-ray appearance potential spectrum (SXAPS) 1. In the presence of a potential spectrometer, the surface of the solid (target) is bombarded with electrons of a certain energy and then the relationship between the intensity of soft X-rays produced and the bombardment of the electron energies is determined photometrically. As you know, in this soft X Ray contains