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利用1982年至1990年在新乡接收ETS－Ⅱ同步卫星136MHz信标所取得的电离层总电子含量TEC月中值和相应的F2层临界频率，计算了电离层板厚，分析比较了电离层板厚、TEC和F2层临界频率的日变化、季节变化和太阳活动变化的差异，给出了板厚随太阳活动的抛物关系，建立了新乡的电离层极厚模式，并与国际参考电离层和中国参考电离层模式的结果进行了比较。结果表明，本文的板厚模式预报的结果在太阳活动高年较国际参考电离层（IRI）和中国参考电离层（CRI）大为改善。
The ionospheric total thickness (TEC) and the corresponding F2 layer critical frequency obtained from receiving 136 MHz beacons of ETS-Ⅱ synchronous satellite in Xinxiang from 1982 to 1990 were used to calculate the ionospheric plate thickness. The ionospheric plate thickness The diurnal variation, seasonal variation and solar activity variations of the critical frequencies of thick, TEC and F2 layers give the parabolic relationship between plate thickness and solar activity, and establish the extremely ionospheric thick layer model in Xinxiang, which is related to the international reference ionosphere and The results of China’s reference ionospheric model are compared. The results show that the results of plate thickness prediction in this paper are greatly improved compared with the International Reference Ionosphere (IRI) and China Reference Ionosphere (CRI) during the high solar years.