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基于变形单壁碳纳米管能量色散关系,计算了碳纳米管最低导带的电子速度及有效质量随形变系数变化的各种曲线,以此推测碳纳米管输运性质的稳定性问题.计算结果表明:对于特定类型的碳纳米管,只当其形变发生在某特定方向、且处于低形变(形变系数ε≤0.02)区时,电子平均速度vmean及平均有效质量mm*ean随形变改变才会很小(相对改变量≤2%),这意味着此时的碳纳米管低偏压电子输运性能是基本稳定的.而其他形变情形,电子平均速度vmean或电子平均有效质量mm*ean或两者随形变变化明显,甚至有跃变,这意味着其低偏压电子输运性能是不稳定的,甚至极不稳定.
Based on the energy dispersion relation of the deformed single-walled carbon nanotubes, various curves of electron velocity and effective mass of the lowest conduction band of the carbon nanotubes with the change of strain coefficient were calculated, in order to infer the stability of the transport properties of the carbon nanotubes. It is shown that for a given type of carbon nanotubes, the average electron velocity vmean and the average effective mass mm * ean change with the deformation only when the deformation occurs in a specific direction and is in a zone of low strain (ε ≤ 0.02) (Relative change less than or equal to 2%), which means that the low-voltage electron transport properties of carbon nanotubes are basically stable at this time, while in other cases, the average electron velocity vmean or electron average effective mass mm * ean Both change significantly with the deformation, or even a jump, which means that its low-bias electron transport properties are unstable, or even very unstable.