论文部分内容阅读
在分析提高单片机测控系统可靠性的重要性以及系统干扰主要来源的基础上，从硬件和软件两个方面对提高单片机测控系统的可靠性提出了一些简单、有效、实用和易于实现的一般方法，并重点讨论了程序运行出轨的问题和自动恢复的方法。
On the basis of analyzing the importance of improving the reliability of the MCU system and the main sources of the system interference, this paper presents some simple, effective, practical and easy-to-implement general methods to improve the reliability of the MCU system from both the hardware and software aspects. And focuses on the issue of program derailment and automatic recovery methods.