对于加工带有抛光或精细表面的零件,或者为了获得在一个规定范围内的平均值,经常需要非接触的尺寸测量。电容规通常用于这样的测量,而仅仪要求零件为导体或半导体,并有低于探测器电路充电电阻的有效串联电阻。 For the machining of parts with polished or fine surfaces, or to obtain an average over a specified range, non-contact dimensional measurements are often required. Capacitance gauge is usually used for such measurements, and only the instrument requires the part to be a conductor or a semiconductor and has an effective series resistance that is less than the charge resistance of the detector circuit.