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本文在阐述目前随机逻辑电路交流参数测试较为薄弱、进行动态功能检测较为重要的基础上,介绍了一种新的集成电路测试图形——伪随机码及其在集成电路动态功能测试中的应用.
This paper describes the current random logic circuit AC parameter testing is weak, the dynamic function test is more important based on the introduction of a new integrated circuit test patterns - pseudo-random code and its application in the dynamic function test of integrated circuits.