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利用多层膜反射率的矩阵法计算了GeSbTe超分辨相变光盘的光学参数与各膜层厚度之间的关系 ,最后得到了较为理想的膜层厚度匹配。
The relationship between the optical parameters of GeSbTe superconducting phase-change optical disks and the thickness of each film was calculated by using the matrix method of reflectivity of multilayer films. Finally, the ideal film thickness matching was obtained.