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采用溶胶-凝胶技术在Si(111)和石英基片上制备8%(摩尔分数)Na掺杂ZnO薄膜。用X射线衍射仪、原子力显微镜、扫描电镜和接触角测试仪测试薄膜的微结构、表面形貌和表面接触角。结果表明:所有薄膜均具有较好的c轴择优取向,表面由近六边形棒状颗粒构成。随着退火温度升高,薄膜表面接触角由95°增大到106°。通过对薄膜交替进行紫外光照和黑暗放置(或热处理),可以实现其表面疏水与超亲水性之间的可逆转化,光诱导可逆转化效率随退火温度升高而增大。
An 8% (molar fraction) Na-doped ZnO thin film was prepared on Si (111) and quartz substrates by sol-gel technique. The microstructure, surface morphology and surface contact angle of the films were measured by X-ray diffraction, atomic force microscopy, scanning electron microscopy and contact angle tester. The results show that all the films have good c-axis preferred orientation and the surface consists of nearly hexagonal rod-like particles. With the increase of annealing temperature, the contact angle of the film surface increased from 95 ° to 106 °. The reversible conversion between the surface hydrophobicity and the superhydrophilicity can be achieved by alternating the UV light and darkness (or heat treatment). The light-induced reversible conversion efficiency increases with the annealing temperature.