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针对现有电路板边界扫描器件与非边界扫描器件同时存在,致使测试覆盖率较低的问题,提出对非BS器件模型化分类的测试方法.以器件的可测属性为依据,对其进行分类并抽象建模.将板上器件及线网抽象为有向图,基于迪杰斯特拉算法及广度优先搜索算法,构建了电路板的可达测试模型.对可达测试模型和簇测试模型的生成方法进行了形式化定义,并给出模型的测试方案.实验结果表明,该方法比现有簇测试方法测试覆盖率更高,进一步扩展了板上非BS器件的可测范围,并能很好的应用于自动测试.
In order to solve the problem that existing circuit board boundary scan devices and non-boundary scan devices coexist, resulting in lower test coverage, a test method for modeling non-BS device modeling is proposed. Based on the measurable attributes of the devices, And abstracts the modeling.An on-board device and its network are abstracted as a directed graph, based on Dijkstra algorithm and breadth-first search algorithm, a reachable test model of the circuit board is constructed.Real-tested and cluster test models And the test scheme of the model is given.The experimental results show that this method has higher test coverage than the existing cluster test methods and further extends the measurable range of non-BS devices on board Very good for automatic testing.