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本工作是用X射线衍射法测量锗、硅和合金InSb及GaAs在不同温度的点阵常数,观察它们的热膨涨,并求得它们的膨涨系数。
This work is to measure the lattice constants of germanium, silicon and alloy InSb and GaAs at different temperatures by X-ray diffraction, observe their thermal expansion, and find their expansion coefficient.