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本文阐述了用X射线荧光光谱仪,以薄样一比例常数法测定地质样品中稀土元素的原理、方法和应用。用化学富集法降低检出限。试样制于6μMyIar薄膜或滤纸上测量,按下式计算稀土元素的相对含量C_1。其低、测不准的缺陷。
This paper describes the principle, method and application of X-ray fluorescence spectrometer for the determination of rare earth elements in geological samples by thin-plate-one-constant method. Reduce the detection limit by chemical enrichment. The sample system is measured on 6μMyIar film or filter paper and the relative content of rare earth elements C_1 is calculated as follows. Its low, not sure the defect.