论文部分内容阅读
采用高温固相法制备了Sr0.96Al2O4:Eu0.02,Dy0.02,B0.08长余辉发光材料。利用XRD衍射仪、荧光分光光度计和热释光计量仪对样品进行了测试。对余辉衰减曲线的拟合表明,余辉曲线中的快衰减过程与V˙O˙陷阱有关,而慢衰减过程源于Eu˙Sr和Dy˙Sr陷阱中的电子释放;随着球磨时间的增加,Dy˙Sr陷阱浓度也随之增加。热释光光谱的曲线拟合表明,热释光峰反映的是Dy˙Sr陷阱的特性;当陷阱浓度相差不大时,动力学级次越小,陷阱中电子的局域性越强,基质导带底产生一个由局域态组成的带尾,陷阱深度随之减小。
Sr0.96Al2O4: Eu0.02, Dy0.02, B0.08 long afterglow luminescence materials were prepared by high temperature solid-state reaction. The samples were tested by XRD, fluorescence spectrophotometer and thermoluminescence meter. The fitting of the afterglow decay curve shows that the fast decay process in the afterglow curve is related to the V˙O˙ trap, while the slow decay process is due to the release of electrons in the Eu˙Sr and Dy˙Sr traps. With the increase of milling time, Dy˙Sr trap concentration also increases. The curve fitting of the thermoluminescence spectra shows that the thermoluminescence peak reflects the characteristic of the Dy˙Sr trap. When the trap concentration is not much difference, the smaller the kinetic level, the stronger the localization of the electron in the trap, The bottom of the conduction band has a tail with a local state, and the depth of the trap decreases.